Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
D. Q. Kelly, S. Dey, D. Onsongo, S. K. Banerjee. Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs. Microelectronics Reliability, 45(7-8):1033-1040, 2005. [doi]
Abstract is missing.