ESD Protection for Mixed-Voltage I/O in LowVoltage Thin-Oxide CMOS

Ming-Dou Ker, Wei-Jen Chang, Chang-Tzu Wang, Wen-Yi Chen. ESD Protection for Mixed-Voltage I/O in LowVoltage Thin-Oxide CMOS. In 2006 IEEE International Solid State Circuits Conference, ISSCC 2006, Digest of Technical Papers, an Francisco, CA, USA, February 6-9, 2006. pages 2230-2237, IEEE, 2006. [doi]

Authors

Ming-Dou Ker

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Wei-Jen Chang

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Chang-Tzu Wang

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Wen-Yi Chen

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