Ming-Dou Ker, Wei-Jen Chang, Chang-Tzu Wang, Wen-Yi Chen. ESD Protection for Mixed-Voltage I/O in LowVoltage Thin-Oxide CMOS. In 2006 IEEE International Solid State Circuits Conference, ISSCC 2006, Digest of Technical Papers, an Francisco, CA, USA, February 6-9, 2006. pages 2230-2237, IEEE, 2006. [doi]
@inproceedings{KerCWC06,
title = {ESD Protection for Mixed-Voltage I/O in LowVoltage Thin-Oxide CMOS},
author = {Ming-Dou Ker and Wei-Jen Chang and Chang-Tzu Wang and Wen-Yi Chen},
year = {2006},
doi = {10.1109/ISSCC.2006.1696284},
url = {https://doi.org/10.1109/ISSCC.2006.1696284},
researchr = {https://researchr.org/publication/KerCWC06},
cites = {0},
citedby = {0},
pages = {2230-2237},
booktitle = {2006 IEEE International Solid State Circuits Conference, ISSCC 2006, Digest of Technical Papers, an Francisco, CA, USA, February 6-9, 2006},
publisher = {IEEE},
isbn = {1-4244-0079-1},
}