Ming-Dou Ker, Hsin-Chyh Hsu, Jeng-Jie Peng. Electrostatic Discharge Implantation to Improve Machine-Model ESD Robustness of Stacked NMOS in Mixed-Voltage I/O Interface Circuits. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 363-368, IEEE Computer Society, 2003. [doi]
Abstract is missing.