Ming-Dou Ker, Jeng-Jie Peng, Hsin-Chin Jiang. ESD test methods on integrated circuits: an overview. In Proceedings of the 2001 8th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2001, Malta, September 2-5, 2001. pages 1011-1014, IEEE, 2001. [doi]
Abstract is missing.