Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques - researchr publication authors

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Christoph Kerner, Ivan Ciofi, Thomas Chiarella, Stefaan Van Huylenbroeck. Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 221-225, IEEE, 2012. [doi]

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