Christoph Kerner, Ivan Ciofi, Thomas Chiarella, Stefaan Van Huylenbroeck. Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 221-225, IEEE, 2012. [doi]
Abstract is missing.