Christoph Kerner, Ivan Ciofi, Thomas Chiarella, Stefaan Van Huylenbroeck. Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 221-225, IEEE, 2012. [doi]
@inproceedings{KernerCCH12, title = {Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques}, author = {Christoph Kerner and Ivan Ciofi and Thomas Chiarella and Stefaan Van Huylenbroeck}, year = {2012}, doi = {10.1109/ESSDERC.2012.6343373}, url = {http://dx.doi.org/10.1109/ESSDERC.2012.6343373}, researchr = {https://researchr.org/publication/KernerCCH12}, cites = {0}, citedby = {0}, pages = {221-225}, booktitle = {Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012}, publisher = {IEEE}, isbn = {978-1-4673-1707-8}, }