An FRAM-Based Nonvolatile Logic MCU SoC Exhibiting 100% Digital State Retention at ${\rm VDD}=$ 0 V Achieving Zero Leakage With ${<}$ 400-ns Wakeup Time for ULP Applications

Sudhanshu Khanna, Steven Bartling, Michael Clinton, Scott R. Summerfelt, John A. Rodriguez, Hugh P. McAdams. An FRAM-Based Nonvolatile Logic MCU SoC Exhibiting 100% Digital State Retention at ${\rm VDD}=$ 0 V Achieving Zero Leakage With ${<}$ 400-ns Wakeup Time for ULP Applications. J. Solid-State Circuits, 49(1):95-106, 2014. [doi]

@article{KhannaBCSRM14,
  title = {An FRAM-Based Nonvolatile Logic MCU SoC Exhibiting 100% Digital State Retention at ${\rm VDD}=$ 0 V Achieving Zero Leakage With ${<}$ 400-ns Wakeup Time for ULP Applications},
  author = {Sudhanshu Khanna and Steven Bartling and Michael Clinton and Scott R. Summerfelt and John A. Rodriguez and Hugh P. McAdams},
  year = {2014},
  doi = {10.1109/JSSC.2013.2284367},
  url = {http://dx.doi.org/10.1109/JSSC.2013.2284367},
  researchr = {https://researchr.org/publication/KhannaBCSRM14},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {49},
  number = {1},
  pages = {95-106},
}