Three-dimensional defect sensitivity modeling for open circuits in ULSI structures

M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi. Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. IEEE Trans. on CAD of Integrated Circuits and Systems, 17(4):366-371, 1998. [doi]

Authors

M. K. Kidambi

This author has not been identified. Look up 'M. K. Kidambi' in Google

Akhilesh Tyagi

This author has not been identified. Look up 'Akhilesh Tyagi' in Google

Mohammed R. Madani

This author has not been identified. Look up 'Mohammed R. Madani' in Google

Magdy A. Bayoumi

This author has not been identified. Look up 'Magdy A. Bayoumi' in Google