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M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi. Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. IEEE Trans. on CAD of Integrated Circuits and Systems, 17(4):366-371, 1998. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Parameterized Modeling of Open-Circuit Critical Volume for Three-Dimensional Defects in VLSI ProcessingM. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi. vlsid 1994: 333-338
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