M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi. Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. IEEE Trans. on CAD of Integrated Circuits and Systems, 17(4):366-371, 1998. [doi]
@article{KidambiTMB98,
title = {Three-dimensional defect sensitivity modeling for open circuits in ULSI structures},
author = {M. K. Kidambi and Akhilesh Tyagi and Mohammed R. Madani and Magdy A. Bayoumi},
year = {1998},
doi = {10.1109/43.703826},
url = {http://doi.ieeecomputersociety.org/10.1109/43.703826},
tags = {modeling, source-to-source, open-source},
researchr = {https://researchr.org/publication/KidambiTMB98},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {17},
number = {4},
pages = {366-371},
}