Seonki Kim, Sreejit Chakravarty, Bapiraju Vinnakota. An analysis of the delay defect detection capability of the ECR test method. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 1060-1069, IEEE Computer Society, 2000.
@inproceedings{KimCV00,
title = {An analysis of the delay defect detection capability of the ECR test method},
author = {Seonki Kim and Sreejit Chakravarty and Bapiraju Vinnakota},
year = {2000},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/KimCV00},
cites = {0},
citedby = {0},
pages = {1060-1069},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}