Analytical CAD Models for the Signal Transients and Crosstalk Noise of Inductance-Effect-Prominent Multicoupled RLC Interconnect Lines

Taehoon Kim, Yungseon Eo. Analytical CAD Models for the Signal Transients and Crosstalk Noise of Inductance-Effect-Prominent Multicoupled RLC Interconnect Lines. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(7):1214-1227, 2008. [doi]

Abstract

Abstract is missing.