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Taehoon Kim, Yungseon Eo. Analytical CAD Models for the Signal Transients and Crosstalk Noise of Inductance-Effect-Prominent Multicoupled RLC Interconnect Lines. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(7):1214-1227, 2008. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Compact Models for Signal Transient and Crosstalk Noise of Coupled RLC Interconnect Lines with Ramp InputsTaehoon Kim, Dongchul Kim, Jung-A Lee, Yungseon Eo. delta 2008: 205-209 [doi] Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnectsSeongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim. tvlsi, 12(4):395-407, 2004.
The following publications are possibly variants of this publication: