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Dynamic voltage scaling for SEU-tolerance in low-power memories

Seokjoong Kim, Matthew R. Guthaus. Dynamic voltage scaling for SEU-tolerance in low-power memories. In Srinivas Katkoori, Matthew R. Guthaus, Ayse Kivilcim Coskun, Andreas Burg, Ricardo Reis, editors, 20th IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2012, Santa Cruz, CA, USA, October 7-10, 2012. pages 207-212, IEEE, 2012. [doi]

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Seokjoong Kim

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Matthew R. Guthaus

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