Seokjoong Kim, Matthew R. Guthaus. Dynamic voltage scaling for SEU-tolerance in low-power memories. In Srinivas Katkoori, Matthew R. Guthaus, Ayse Kivilcim Coskun, Andreas Burg, Ricardo Reis, editors, 20th IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2012, Santa Cruz, CA, USA, October 7-10, 2012. pages 207-212, IEEE, 2012. [doi]
@inproceedings{KimG12-6,
title = {Dynamic voltage scaling for SEU-tolerance in low-power memories},
author = {Seokjoong Kim and Matthew R. Guthaus},
year = {2012},
doi = {10.1109/VLSI-SoC.2012.6379031},
url = {http://dx.doi.org/10.1109/VLSI-SoC.2012.6379031},
researchr = {https://researchr.org/publication/KimG12-6},
cites = {0},
citedby = {0},
pages = {207-212},
booktitle = {20th IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2012, Santa Cruz, CA, USA, October 7-10, 2012},
editor = {Srinivas Katkoori and Matthew R. Guthaus and Ayse Kivilcim Coskun and Andreas Burg and Ricardo Reis},
publisher = {IEEE},
isbn = {978-1-4673-2657-5},
}