Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung. At-Speed Interconnect Test and Diagnosis of External Memories on a System. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 156-162, IEEE, 2004. [doi]
Abstract is missing.