Resistive Switching Characteristics of Silicon Nitride-Based RRAM Depending on Top Electrode Metals

Sungjun Kim, Sunghun Jung, Min-Hwi Kim, Seongjae Cho, Byung-Gook Park. Resistive Switching Characteristics of Silicon Nitride-Based RRAM Depending on Top Electrode Metals. IEICE Transactions, 98-C(5):429-433, 2015. [doi]

Abstract

Abstract is missing.