Clock design techniques considering circuit reliability

YongHwan Kim, Minseok Kang, Kyoung-Hwan Lim, Sangdo Park, Deokjin Joo, Taewhan Kim. Clock design techniques considering circuit reliability. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 142-145, IEEE, 2011. [doi]

Authors

YongHwan Kim

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Minseok Kang

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Kyoung-Hwan Lim

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Sangdo Park

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Deokjin Joo

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Taewhan Kim

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