YongHwan Kim, Minseok Kang, Kyoung-Hwan Lim, Sangdo Park, Deokjin Joo, Taewhan Kim. Clock design techniques considering circuit reliability. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 142-145, IEEE, 2011. [doi]
Abstract is missing.