YongHwan Kim, Minseok Kang, Kyoung-Hwan Lim, Sangdo Park, Deokjin Joo, Taewhan Kim. Clock design techniques considering circuit reliability. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 142-145, IEEE, 2011. [doi]
@inproceedings{KimKLPJK11,
title = {Clock design techniques considering circuit reliability},
author = {YongHwan Kim and Minseok Kang and Kyoung-Hwan Lim and Sangdo Park and Deokjin Joo and Taewhan Kim},
year = {2011},
doi = {10.1109/ISOCC.2011.6138667},
url = {http://dx.doi.org/10.1109/ISOCC.2011.6138667},
researchr = {https://researchr.org/publication/KimKLPJK11},
cites = {0},
citedby = {0},
pages = {142-145},
booktitle = {International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0709-4},
}