Cold- and hot-switching lifetime characterizations of ohmic-contact RF MEMS switches - researchr publication authors

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Jong Man Kim, Sanghyo Lee, Chang-Wook Baek, Youngwoo Kwon, Yong-Kweon Kim. Cold- and hot-switching lifetime characterizations of ohmic-contact RF MEMS switches. IEICE Electronic Express, 5(11):418-423, 2008. [doi]

This author has not been identified. Look up 'Jong Man Kim' in GoogleThis author has not been identified. Look up 'Sanghyo Lee' in GoogleThis author has not been identified. Look up 'Chang-Wook Baek' in GoogleThis author has not been identified. Look up 'Youngwoo Kwon' in GoogleThis author has not been identified. Look up 'Yong-Kweon Kim' in Google

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