Dongok Kim, Irith Pomeranz, Enamul Amyeen, Srikanth Venkataraman. Prioritizing the Application of DFM Guidelines Based on the Detectability of Systematic Defects. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 217-220, IEEE Computer Society, 2008. [doi]
Abstract is missing.