Dynamic reliability management for near-threshold dark silicon processors - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Taeyoung Kim, Zeyu Sun, Chase Cook, Jagadeesh Gaddipati, Hai Wang, Hai-Bao Chen, Sheldon X.-D. Tan. Dynamic reliability management for near-threshold dark silicon processors. In Frank Liu, editor, Proceedings of the 35th International Conference on Computer-Aided Design, ICCAD 2016, Austin, TX, USA, November 7-10, 2016. pages 70, ACM, 2016. [doi]

This author has not been identified. Look up 'Taeyoung Kim' in GoogleThis author has not been identified. Look up 'Zeyu Sun' in GoogleThis author has not been identified. Look up 'Chase Cook' in GoogleThis author has not been identified. Look up 'Jagadeesh Gaddipati' in GoogleThis author has not been identified. Look up 'Hai Wang' in GoogleThis author has not been identified. Look up 'Hai-Bao Chen' in GoogleThis author has not been identified. Look up 'Sheldon X.-D. Tan' in Google

runs on WebDSL