Taeyoung Kim, Zeyu Sun, Chase Cook, Jagadeesh Gaddipati, Hai Wang, Hai-Bao Chen, Sheldon X.-D. Tan. Dynamic reliability management for near-threshold dark silicon processors. In Frank Liu, editor, Proceedings of the 35th International Conference on Computer-Aided Design, ICCAD 2016, Austin, TX, USA, November 7-10, 2016. pages 70, ACM, 2016. [doi]
@inproceedings{KimSCGWCT16,
title = {Dynamic reliability management for near-threshold dark silicon processors},
author = {Taeyoung Kim and Zeyu Sun and Chase Cook and Jagadeesh Gaddipati and Hai Wang and Hai-Bao Chen and Sheldon X.-D. Tan},
year = {2016},
doi = {10.1145/2966986.2980080},
url = {http://doi.acm.org/10.1145/2966986.2980080},
researchr = {https://researchr.org/publication/KimSCGWCT16},
cites = {0},
citedby = {0},
pages = {70},
booktitle = {Proceedings of the 35th International Conference on Computer-Aided Design, ICCAD 2016, Austin, TX, USA, November 7-10, 2016},
editor = {Frank Liu},
publisher = {ACM},
isbn = {978-1-4503-4466-1},
}