Taeyoung Kim, Zeyu Sun, Chase Cook, Jagadeesh Gaddipati, Hai Wang, Hai-Bao Chen, Sheldon X.-D. Tan. Dynamic reliability management for near-threshold dark silicon processors. In Frank Liu, editor, Proceedings of the 35th International Conference on Computer-Aided Design, ICCAD 2016, Austin, TX, USA, November 7-10, 2016. pages 70, ACM, 2016. [doi]
Abstract is missing.