Reliability of amorphous InGaZnO TFTs with ITO local conducting buried layer for BEOL power transistors - researchr publication authors

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Hyun Jong Kim, Byung Sang Song, Won-Ju Cho, Jong-Tae Park. Reliability of amorphous InGaZnO TFTs with ITO local conducting buried layer for BEOL power transistors. Microelectronics Reliability, 76:333-337, 2017. [doi]

This author has not been identified. Look up 'Hyun Jong Kim' in GoogleThis author has not been identified. Look up 'Byung Sang Song' in GoogleThis author has not been identified. Look up 'Won-Ju Cho' in GoogleThis author has not been identified. Look up 'Jong-Tae Park' in Google

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