The following publications are possibly variants of this publication:
- Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with ITO local conducting buried layerSang-Min Kim, Min-Soo Kang, Won-Ju Cho, Jong-Tae Park. mr, 76:327-332, 2017. [doi]
- Device instability of amorphous InGaZnO thin film transistors with transparent source and drainSang-Min Kim, Min-Ju Ahn, Won-Ju Cho, Jong-Tae Park. mr, 64:575-579, 2016. [doi]