Hyun Jong Kim, Byung Sang Song, Won-Ju Cho, Jong-Tae Park. Reliability of amorphous InGaZnO TFTs with ITO local conducting buried layer for BEOL power transistors. Microelectronics Reliability, 76:333-337, 2017. [doi]
@article{KimSCP17,
title = {Reliability of amorphous InGaZnO TFTs with ITO local conducting buried layer for BEOL power transistors},
author = {Hyun Jong Kim and Byung Sang Song and Won-Ju Cho and Jong-Tae Park},
year = {2017},
doi = {10.1016/j.microrel.2017.06.023},
url = {https://doi.org/10.1016/j.microrel.2017.06.023},
researchr = {https://researchr.org/publication/KimSCP17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {333-337},
}