Andrew Kim, Ernest Y. Wu, Baozhen Li, Barry P. Linder. Transformation of Ramped Current Stress VBDto Constant Voltage Stress TDDB TBD. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{KimWLL19,
title = {Transformation of Ramped Current Stress VBDto Constant Voltage Stress TDDB TBD},
author = {Andrew Kim and Ernest Y. Wu and Baozhen Li and Barry P. Linder},
year = {2019},
doi = {10.1109/IRPS.2019.8720572},
url = {https://doi.org/10.1109/IRPS.2019.8720572},
researchr = {https://researchr.org/publication/KimWLL19},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}