Admittance Control-based Bilateral Control System Considering Position Error

Shuhei Kimura, Takahiro Nozaki, Toshiyuki Murakami. Admittance Control-based Bilateral Control System Considering Position Error. In IEEE International Conference on Mechatronics, ICM 2021, Kashiwa, Japan, March 7-9, 2021. pages 1-6, IEEE, 2021. [doi]

Abstract

Abstract is missing.