Tetsuji Kishi, Mitsuyasu Ohta, Takashi Taniguchi, Hiroshi Kadota. A New Inter-Core Built-In-Self-Test Circuits for Tri-State Buffers in the System on a Chip. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 462, IEEE Computer Society, 2001. [doi]
Abstract is missing.