A new model for thermal channel noise of deep-submicron MOSFETs and its application in RF-CMOS design

Gerhard Knoblinger, Peter Klein, Marc Tiebout. A new model for thermal channel noise of deep-submicron MOSFETs and its application in RF-CMOS design. J. Solid-State Circuits, 36(5):831-837, 2001. [doi]

Abstract

Abstract is missing.