Ho Fai Ko, Nicola Nicolici. Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 454-459, IEEE Computer Society, 2004. [doi]
@inproceedings{KoN04:0,
title = {Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing},
author = {Ho Fai Ko and Nicola Nicolici},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/ats/2004/2235/00/22350454abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/KoN04%3A0},
cites = {0},
citedby = {0},
pages = {454-459},
booktitle = {13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2235-1},
}