Ho Fai Ko, Nicola Nicolici. Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 454-459, IEEE Computer Society, 2004. [doi]
No references recorded for this publication.
No citations of this publication recorded.