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Ho Fai Ko, Nicola Nicolici. Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 454-459, IEEE Computer Society, 2004. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: RTL Scan Design for Skewed-Load At-speed Test under Power ConstraintsHo Fai Ko, Nicola Nicolici. iccd 2006: 237-242 [doi] Functional Illinois Scan Design at RTLHo Fai Ko, Nicola Nicolici. iccd 2004: 78-81 [doi]
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