Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections - researchr publication authors

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Keitaro Koga, Hiromitsu Awano, Makoto Ikeda. Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 201-205, IEEE Computer Society, 2017. [doi]

This author has not been identified. Look up 'Keitaro Koga' in GoogleThis author has not been identified. Look up 'Hiromitsu Awano' in GoogleThis author has not been identified. Look up 'Makoto Ikeda' in Google

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