Keitaro Koga, Hiromitsu Awano, Makoto Ikeda. Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 201-205, IEEE Computer Society, 2017. [doi]
@inproceedings{KogaAI17,
title = {Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections},
author = {Keitaro Koga and Hiromitsu Awano and Makoto Ikeda},
year = {2017},
doi = {10.1109/ATS.2017.46},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2017.46},
researchr = {https://researchr.org/publication/KogaAI17},
cites = {0},
citedby = {0},
pages = {201-205},
booktitle = {26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-2437-1},
}