Keitaro Koga, Hiromitsu Awano, Makoto Ikeda. Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip Connections. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 201-205, IEEE Computer Society, 2017. [doi]
Abstract is missing.