Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty. A Design-for-Test Solution for Monolithic 3D Integrated Circuits. In 2017 IEEE International Conference on Computer Design, ICCD 2017, Boston, MA, USA, November 5-8, 2017. pages 685-688, IEEE Computer Society, 2017. [doi]
@inproceedings{KoneruKC17-0,
title = {A Design-for-Test Solution for Monolithic 3D Integrated Circuits},
author = {Abhishek Koneru and Sukeshwar Kannan and Krishnendu Chakrabarty},
year = {2017},
doi = {10.1109/ICCD.2017.119},
url = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2017.119},
researchr = {https://researchr.org/publication/KoneruKC17-0},
cites = {0},
citedby = {0},
pages = {685-688},
booktitle = {2017 IEEE International Conference on Computer Design, ICCD 2017, Boston, MA, USA, November 5-8, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-2254-4},
}