Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty. A Design-for-Test Solution for Monolithic 3D Integrated Circuits. In 2017 IEEE International Conference on Computer Design, ICCD 2017, Boston, MA, USA, November 5-8, 2017. pages 685-688, IEEE Computer Society, 2017. [doi]
No references recorded for this publication.
No citations of this publication recorded.