Exploiting narrow-width values for process variation-tolerant 3-D microprocessors - researchr publication authors

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Joonho Kong, Sung Woo Chung. Exploiting narrow-width values for process variation-tolerant 3-D microprocessors. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 1197-1206, ACM, 2012. [doi]

This author has not been identified. Look up 'Joonho Kong' in GoogleThis author has not been identified. Look up 'Sung Woo Chung' in Google

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