Exploiting narrow-width values for process variation-tolerant 3-D microprocessors

Joonho Kong, Sung Woo Chung. Exploiting narrow-width values for process variation-tolerant 3-D microprocessors. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 1197-1206, ACM, 2012. [doi]

@inproceedings{KongC12,
  title = {Exploiting narrow-width values for process variation-tolerant 3-D microprocessors},
  author = {Joonho Kong and Sung Woo Chung},
  year = {2012},
  doi = {10.1145/2228360.2228581},
  url = {http://doi.acm.org/10.1145/2228360.2228581},
  researchr = {https://researchr.org/publication/KongC12},
  cites = {0},
  citedby = {0},
  pages = {1197-1206},
  booktitle = {The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012},
  editor = {Patrick Groeneveld and Donatella Sciuto and Soha Hassoun},
  publisher = {ACM},
  isbn = {978-1-4503-1199-1},
}