Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions - researchr publication authors

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Yachen Kong, Meng Zhang 0014, Xuepeng Zhan, Rui Cao, Jiezhi Chen. Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(11):4042-4051, 2020. [doi]

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