The following publications are possibly variants of this publication:
- A Bayesian indicator for Run-to-Run Performance Assessment using Industrail RiskTaki Eddine Korabi, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton. wsc 2018: 3592-3602 [doi]
- Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturingJakey Blue, Agnes Roussy, Jacques Pinaton. wsc 2016: 2523-2534 [doi]
- A physics-informed Run-to-Run control framework for semiconductor manufacturingWei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis. eswa, 155:113424, 2020. [doi]
- Run To Run control based on categorical output in semiconductor manufacturingEl Mostafa El Adel, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton. icsc2 2016: 180-185 [doi]