Selçuk Köse, Eby G. Friedman. IR voltage drop analysis exploiting locality. In Leon Stok, Nikil D. Dutt, Soha Hassoun, editors, Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011. pages 996-1001, ACM, 2011. [doi]
Abstract is missing.