Zdenek Kotásek, Jaroslav Skarvada, Josef Strnadel. The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption. In Sebastián López, editor, 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2010, 1-3 September 2010, Lille, France. pages 644-651, IEEE, 2010. [doi]
Abstract is missing.