Nagothu Karmel Kranthi, B. Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava. Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
@inproceedings{KranthiKSBS20,
title = {Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices},
author = {Nagothu Karmel Kranthi and B. Sampath Kumar and Akram A. Salman and Gianluca Boselli and Mayank Shrivastava},
year = {2020},
doi = {10.1109/IRPS45951.2020.9129624},
url = {https://doi.org/10.1109/IRPS45951.2020.9129624},
researchr = {https://researchr.org/publication/KranthiKSBS20},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}