Nagothu Karmel Kranthi, B. Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava. Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.